Figure 3. Measurement and fitting results for G mode intensities as a function of the V_sd.

(a), Device A during V_sd upward scan. (b), Device A during V_sd downward scan. (c), Device B during V_sd upward scan. The data points are fitted with the curve from Fig. 3a in C.-F. Chen et al.'s paper¹⁵ after shifting 0.38 eV (the difference between excitation photon energies, 785 nm to 633 nm or 1.58 eV to 1.96 eV). We only use the V_sd ≥ 9 V data points for the fitting in order to give a better fitting weight for the high bias data points.