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. 2014 Jul 21;9(7):e103129. doi: 10.1371/journal.pone.0103129

Figure 3. Representative SEM micrographs of pollen, showing variation in exine sculpture.

Figure 3

A–G, laevigate or foveolate surface with seams; H–K, laevigate or foveolate surface without seams. A–B, Tainia hongkongensis (treated as Ania hongkongensis); C–D, T. penangiana (treated as Ania penangiana); E, T. viridifusca (treated as Ania viridifusca); F, T. angustifolia (treated as Ania angustifolia); G, T. ruybarrettoi (treated as Ania ruybarrettoi); H, T. dunnii; I, T. latifolia; J, T. cordifolia; K, Nephelaphyllum pulchrum; L, Collabium chinense. Arrows indicate seams. – Scale bars: 10 µm (A, C, I, J, K), 5 µm (H, L), 2 µm (B, D–G).