Skip to main content
. 2014 Jun 25;9(1):318. doi: 10.1186/1556-276X-9-318

Figure 3.

Figure 3

Porous Si SEM images used for the calculation of Hausdorff dimension. Examples of cross-sectional SEM images (a1) and top view images (b1) of the studied porous Si layer with their corresponding binary images (a2) and (b2), used for the calculation of the box counting dimension.