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. 2014 Jul 25;70(Pt 8):993–1008. doi: 10.1107/S2053230X14016574

Figure 12.

Figure 12

An example of a crystal image with X-ray rastering information overlaid to accurately define the crystal position within the loop. By repeating the process in a perpendicular direction the precise three-dimensional position of the crystal and the strongest diffracting area is obtained. For scale, in this case each rastered pixel is 20 × 20 µm.