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. 2014 Jul 19;47(Pt 4):1459–1465. doi: 10.1107/S1600576714011996

Figure 3.

Figure 3

The description of diffraction geometry for the rotation method using dxtbx models. A monochromatic X-ray beam is represented by the wavevector Inline graphic, which intersects a sample rotation axis, given by the unit vector Inline graphic, at the origin of the reciprocal laboratory coordinate system. An abstract detector plane k is described in the real space laboratory coordinate system with an origin vector Inline graphic and a pair of orthogonal basis vectors Inline graphic. The detector model provides a pair of limits, Inline graphic and Inline graphic, forming a bounded rectangular panel within the plane. A crystal model complements the dxtbx geometry models, with its setting expressed in a ϕ-axis frame (aligned to the reciprocal laboratory frame at a rotation angle of ϕ = 0°) by the setting matrix Inline graphic, following the Protein Data Bank (http://www.pdb.org/pdb/home/home.do) convention. Diffraction is represented by the wavevector Inline graphic, which may be extended to the point Inline graphic at which it meets the detector panel, in the panel’s coordinate frame.