| Agilent Eos Gemini diffractometer | 2168 independent reflections |
| Radiation source: Enhance (Cu) X-ray Source | 1934 reflections with I > 2σ(I) |
| Detector resolution: 16.0416 pixels mm-1 | Rint = 0.025 |
| ω scans | θmax = 71.3°, θmin = 4.1° |
| Absorption correction: multi-scan (CrysAlis PRO and CrysAlis RED; Agilent, 2012) | h = −5→6 |
| Tmin = 0.756, Tmax = 1.000 | k = −4→6 |
| 3374 measured reflections | l = −26→26 |
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