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. 2014 Aug 8;4:5998. doi: 10.1038/srep05998

Figure 7.

Figure 7

(a) Schematic diagram of single CuSe nanosheet-based electrical circuit for C-AFM measurement. (b) Topography and (c, d) current images of CuSe nanosheet are obtained simultaneously under the C-AFM mode. The applied bias voltage is (c) 100 mV and (d) −100 mV. (e, f) Spatial profiles of the current along corresponding lines in the C-AFM images (c, d).