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. 2014 Jul 26;9(1):366. doi: 10.1186/1556-276X-9-366

Figure 3.

Figure 3

AFM and HRTEM images for TiN layer. (a) Atomic force microscope (AFM) image shows surface roughness of TiN layer with a scan area of 1× 1 μm2. (b)The TiN surface is oxidized and is observed by high-resolution transmission electron microscope (HRTEM) image.