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. 2014 Jul 26;9(1):366. doi: 10.1186/1556-276X-9-366

Figure 4.

Figure 4

Current–voltage (I-V) characteristics and statistical distribution. (a) Current–voltage (I-V) characteristics of randomly measured 100 devices at a high CC of 70 mA. Statistical distribution of (b) forming voltage, (c) current levels at IRL and LRS for the Al/Cu/Al2O3/TiN CBRAM devices.