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. 2014 Jul 11;6(15):13209–13220. doi: 10.1021/am503043t

Figure 3.

Figure 3

(A) Profilometry diagrams of three different PCL/HAp films synthesized: (a) flat; (b) topographically disordered; (c) topographically ordered. (B) X-ray diffractograms of PCL/HAp films in transmission and reflection modes and the intensity of (110) reflection of PCL and (200) reflection of HAp in PCL/HAp films as a function of the angle, φ, denoting rotation around the axis perpendicular to the sample plane in the transmission mode. Diffraction peaks indexed with * are PCL-derived, whereas those indexed with + are HAp-derived.