Table 4.
Atomic composition of APDMS, PEG2000– and PEG5000–silica surfaces determined by XPS analysis
| Sample | Composition (at.%)
|
||||
|---|---|---|---|---|---|
| C | N | Si | O | –CO–/–CH2– | |
| APDMS | 12.8 ± 0.4 | 1.7 ± 0.3 | 37.2 ± 0.2 | 48.2 ± 0.5 | - |
| PEG2000 | 31.5 ± 0.2 | 0.8 ± 0.1 | 22.9 ± 0.1 | 44.8 ± 0.1 | 8.6 ± 0.2 |
| PEG5000 | 40.6 ± 0.2 | 0.6 ± 0.2 | 16.9 ± 0.4 | 42.0 ± 0.1 | 10.4 ± 1.1 |
An average for two samples is given.