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. 2014 Aug 5;6(3):312–317. doi: 10.4055/cios.2014.6.3.312

Table 1.

Displacement and Maximum Load to Failure Data of Specimens Fitted with LP, DP, and IN Constructs

graphic file with name cios-6-312-i001.jpg

Statistical analysis was performed by the Kruskal-Wallis test.

LP: lateral plating, DP: double plating, IN: intramedullary nailing, SD: standard deviation.