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. Author manuscript; available in PMC: 2014 Sep 3.
Published in final edited form as: Structure. 2004 Sep;12(9):1607–1618. doi: 10.1016/j.str.2004.06.019

Table 1. Crystallographic Data and Refinement Statistics.

Data Collection Refinement
Cell dimensions (Å) a = b = 71.9 Number of reflections: working/free 12,591/394
c = 140.9 R factor (%)c
 Working set 26.3
Space group P3221  Test set 29.4
X-ray wavelength (Å) 0.979 Rmsd from ideality
Resolution range (Å) 50–2.6  Bond length (Å) 0.0252
Number of observations 62,468  Bond angles (°) 2.417
Number of unique reflections 13,020 Most favored region (%)d 77.0
Completeness (%)a 97.4 (77.7) Additional allowed region (%)d 23.0
Rsym(%)a,b 11.2 (48.6) Disallowed region (%)d 0.0
a

Numbers in parentheses represent values in the highest resolution shell.

b

Rsym=hn|II|IhnI, where I is observed integrated intensity and <I> is the averaged integrated intensity taken over n measurements for reflection h.

c

R factor=h||Fo||Fc||Ih|Fo|, where Fo is the observed structure factor amplitude and Fc is the calculated structure factor amplitudes based on the refined atomic positions, taken over the h reflections in the observed data set.

d

In the Ramachandran plot.