Figure 2.
(a) Crystals of native TmFliPP. Crystals obtained using 36% MPD, 0.1 M phosphate–citrate pH 4.4. (b) Diffraction image of the TmFliPP crystal grown from the optimized condition. A typical X-ray pattern of the TmFliPP crystal collected on beamline BL41XU at SPring-8. The inset shows a close-up view of the diffraction image. (c) Bijvoet difference Patterson map at w = 0.33 Harker section calculated from the TmFliPp SeMet-derivative data at 3.5 Å resolution. The contour lines are drawn from 2.0σ to 6.0σ with an increment of 0.5σ.
