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. 2014 Aug 7;114(17):8499–8541. doi: 10.1021/cr4007297

Figure 17.

Figure 17

Plan view schematic diagrams of different sample geometries for X-ray fluorescence imaging. The geometry shown in (a) has the plane of the sample oriented at 45° to the incident beam, while that shown in (b) has the sample plane oriented at normal incidence to the illuminating X-ray beam.