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. 2014 Sep 17;5:471. doi: 10.3389/fpls.2014.00471

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Copyright © 2014 Tesson and Charrier.

This is an open-access article distributed under the terms of the Creative Commons Attribution License (CC BY). The use, distribution or reproduction in other forums is permitted, provided the original author(s) or licensor are credited and that the original publication in this journal is cited, in accordance with accepted academic practice. No use, distribution or reproduction is permitted which does not comply with these terms.

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Atomic force microscopy. (A) Schematic representation of the AFM setting. (B) Optical micrograph of the AFM cantilever located at the surface of a round cell of E. siliculosus filament. (C) Example of force curve, x axis represents the z motion of the cantilever and y axis represents the force applied at the surface of the cell. (D) Elasticity map of a 1 μm² area consisting of an array of 16 by 16 force curves.