Table 1. X-ray data collection and model refinement statistics.
Data Collection | |
Crystal size (mm) | 0.7×0.05×0.05 |
Space group | P212121 |
Unit cell parameters (Å) | a = 27.27, b = 31.24, c = 35.74 |
X-ray source | BESSY 14.1 |
Temperature (K) | 100 |
No. of images | 360a/180/52 |
Oscillation angle (°) | 1.0a/2.0/1.0 |
Wavelength (Å) | 0.91841a/0.80000/0.80000 |
Resolution (Å) | 20.00–0.98 (1.01–0.98)b |
R int c(%) | 7.2 (46.0) |
<I/σI> | 22.52 (2.04) |
Reflections | |
measured | 222092 |
unique | 17179 |
in test set | 1031 |
Mosaicity (°) | 0.13 |
Completeness (%) | 94.8 (84.5) |
Redundancy | 12.9 (2.3) |
Wilson B-factor (Å2) | 8.2 |
Refinement | |
Resolution (Å) | 20.00–0.98 (1.02–0.98) |
No. reflections | 17179 (1790) |
R work/R free d | 10.57/12.91 |
No. of atoms | |
protein | 328 |
solvent | 96 |
B-factors (Å2) | |
protein | 6.5 |
solvent | 12.1 |
Rmsd from ideal | |
bond lengths (Å) | 0.023 |
angle distances (Å) | 0.058 |
Ramachandran statistics (%) | |
favored | 90.6 |
additional | 9.4 |
PDB code | 4hgu |
Values for crystal no. 1.
Values in parentheses are for the highest resolution shell.
R int = ΣhklΣi|Ii(hkl)−<I(hkl)>|/ΣhklΣi I i(hkl), where I i(hkl) is the ith measurement of the intensity of reflection hkl and <I(hkl)> is the mean intensity of reflection hkl.
R = Σ||F o|−|F c||/Σ|F o|, where F o and F c are the observed and calculated structure factor amplitudes, respectively.