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. 2014 Aug 20;6(17):14836–14843. doi: 10.1021/am501351c

Figure 4.

Figure 4

Ferroelectric properties of a 170 nm thick BSMO film on Nb-STO. (a) Amplitude (triangle and blue line) and phase (square and red line) of the PFM signal as a function of bias voltage. (b) PFM phase contrast scan at RT on BSMO after −5 V writing (5 × 5 μm2), 5 V rewriting (3 × 3 μm2), and −5 V rewriting (1 × 1 μm2) at RT, directly after writing (left), and after 72 h (right).