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. 2014 Sep 27;70(Pt 10):2652–2666. doi: 10.1107/S1399004714017039

Table 2. Data-reduction statistics for the semi-synthetic multi-lattice data sets, excluding overlapping reflections prior to scaling, using N σ = 3, where N σ is the number of standard deviations used to calculate the reflection mask.

Values in parentheses are for the outer resolution shell.

Data set 12 × one-lattice 6 × two-lattice 4 × three-lattice 3 × four-lattice 2 × six-lattice
Resolution range Å) 43.85–1.30 (1.35–1.30) 43.85–1.30 (1.35–1.30) 43.85–1.30 (1.35–1.30) 43.85–1.30 (1.35–1.30) 43.87–1.30 (1.35–1.30)
No. of reflections: total/unique 225096/51437 207352/51242 187700/50804 167348/50193 111993/46119
No. of rejected reflections 70 75 177 162 130
Fraction of overlaps (%) 6.3–9.4 15.0–18.0 22.7–30.9 45.3–55.1
Completeness (%) 98.1 (99.3) 97.7 (99.0) 96.8 (98.0) 95.7 (96.0) 87.8 (85.3)
Multiplicity 4.4 (4.3) 4.0 (3.9) 3.7 (3.5) 3.3 (3.1) 2.4 (2.1)
R meas (%) 3.0 (8.8) 3.2 (10.4) 3.3 (11.8) 3.5 (12.8) 4.0 (21.4)
R p.i.m. (%) 1.4 (4.1) 1.5 (5.0) 1.6 (6.0) 1.8 (6.8) 2.2 (12.9)
I/σ(I)〉 34.8 (15.8) 31.1 (13.0) 27.8 (10.6) 32.4 (10.3) 20.7 (6.4)
CC1/2 (%) 99.8 (99.3) 99.9 (99.0) 99.9 (98.5) 99.9 (98.2) 99.8 (92.4)