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. 2014 Oct 10;4:6570. doi: 10.1038/srep06570

Figure 2.

Figure 2

(a) UPS spectra of indium-tin oxide (ITO), PEDOT: PSS (35 nm), different thickness of HAPAN (1.3 nm, 5.0 nm and 30 nm) film on ITO substrate, respectively. (b) UV-Vis absorption spectra of the different thickness of HAPAN layers (1.3 nm, 5.0 nm, 10 nm, 30 nm) on the quartz glass. (c) AFM height images of bare ITO film, 5.0 nm HAPAN-coated ITO film and 1.3 nm HAPAN-coated ITO film.