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. 2014 Oct 3;12:41. doi: 10.1186/s12951-014-0041-9

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© Gurunathan et al.; licensee BioMed Central Ltd. 2014

This is an Open Access article distributed under the terms of the Creative Commons Attribution License (http://creativecommons.org/licenses/by/4.0), which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly credited. The Creative Commons Public Domain Dedication waiver (http://creativecommons.org/publicdomain/zero/1.0/) applies to the data made available in this article, unless otherwise stated.

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XRD patterns of GO and EGFP-rGO. In the XRD pattern of GO (top panel), the strong and sharp peak at 2θ = 11.7° corresponds to an interlayer distance of 7.6 Å. EGFP-rGO (bottom panel) has a broad peak centered at 2θ = 25.8°, which corresponds to an interlayer distance of 3.6 Å. These XRD results are related to the reduction of GO by EGFP and the process of removing intercalated water molecules and oxide groups. At least three independent experiments were performed for each sample and reproducible results were obtained. Data from a representative experiment are shown.