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. 2014 Oct 13;9(1):571. doi: 10.1186/1556-276X-9-571

Table 3.

Typical XRD diffraction peaks of the Si-nc powders obtained by PSi with different current densities

Ref. [[47],[60]] peak position (PP) Sample M-09
Sample M-10
Sample M-14
Sample M-16
Sample M-17
Sample M-19
PP Size (nm) PP Size (nm) PP Size (nm) PP Size (nm) PP Size (nm) PP Size (nm)
28.44
28.34
41.57
28.33
98.63
28.33
61.83
28.41
72.43
28.32
43.30
28.18
52.22
47.30
47.19
44.75
47.19
42.53
47.24
60.37
47.25
41.64
47.24
39.34
47.06
32.20
56.12
56.02
50.28
56.02
122.7
56.02
56.10
56.08
38.19
55.99
37.48
55.85
56.9
69.13
68.98
48.35
68.97
39.10
68.12
32.75
69.06
80.54
68.91
60.07
69.06
99.88
76.38 76.26 44.5 76.26 40.27 76.27 39.26 76.31 38.16 76.17 44.05 76.13 48.98

The different planes of Si are indexed according to JCPDS card 27–1402.