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. 2014 Oct 22;4:6725. doi: 10.1038/srep06725

Figure 3. BE-ESM images of the NiO film with various types defects.

Figure 3

BE-ESM images of the region with both dislocations and square hills (a–c) and with dislocations only (d–f). a, d AFM topographic image. b, e Amplitude maps at the resonance frequency. c, f Resonance frequency map. Small (blue) arrows indicate dislocations and large (green) arrows indicate a square defect. The region shown by black arrows are showing reverse relationship between resonance frequency map and amplitude map compared to the other region.