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. 2014 Oct 22;4:6725. doi: 10.1038/srep06725

Figure 5. FORC ESM ionic transport maps.

Figure 5

FORC ESM spatial maps of NiO film with dislocations and a square defect. (a) Topographic image of the measured region. Spatial maps of the ESM parameters: (b) ESM loop area (Arrows show the points with large response in the square defect), (c) maximum difference of the surface displacement, (e) imprint, and (f) nucleation bias. (d) ESM hysteresis loops extracted at the points shown by dots in a. Each loop is averaged for six points.