. Author manuscript; available in PMC: 2014 Oct 31.

Published in final edited form as: Adv Eng Mater. 2014 May;16(5):476–481. doi: 10.1002/adem.201400015

Table 2.

Current equipment available at the Stanford Nanocharacterization Laboratory

	Equipment
Microscopes	FEI XL30 Sirion Scanning Electron Microscope
	FEI Magellan 400 XHR Scanning Electron Microscope
	FEI Strata 235DB Dual Beam Focused Ion Beam/Scanning Electron
	Microscope
	FEI Helios NanoLab 600i Dual Beam Focused Ion Beam/Scanning
	Electron Microscope
	FEI Tecnai G2 F20 X-TWIN Transmission Electron Microscope
	FEI Titan 80-300 Environmental Transmission Electron Microscope
	JEOL JXA-8230 SuperProbe Electron Microprobe
Spectrometers	PHI 700 Scanning Auger Nanoprobe
	SSI S-Probe X-ray Photoelectron Spectrometer
	PHI VersaProbe X-ray Photoelectron Spectrometer
	Cameca Nano Secondary Ion Mass Spectrometer 50L
Diffractometers	PANalytical X'Pert Pro X-ray diffractometer
	PANalytical X'Pert Pro X-ray diffractometer
	Multiwire MWL 100 Real-Time Back-Reflection Laue Camera System
	Bruker D8 Discover X-ray diffractometer
	Bruker D8 Venture X-ray diffractometer
Scanning Probes	Park Systems XE-70 Scanning Probe Microscope
	Park Systems XE-100 Scanning Probe Microscope
	WITec alpha500 Confocal Raman and Atomic Force Microscope