Table 3.
Financial breakdown for the Stanford Nanocharacterization Laboratory for the 2012 academic year showing the hourly rate, hours used, income, expenses, and number of users by equipment type
| Hourly Rate [$] | Hours Used | Income [$] | Expenses | Staff | Staff FTE[a] | Number of Users | |
|---|---|---|---|---|---|---|---|
| Scanning Electron Microscope (SEM) | 45 | 4716 | 226,187 | 248,668 | 4 | 1.05 | 358 |
| Transmission Electron Microscope (TEM) | 99 | 4971 | 420,923 | 405,090 | 3 | 1.8 | 104 |
| Focused Ion Beam (FIB) | 78 | 3711 | 249,441 | 242,904 | 2 | 0.85 | 145 |
| X-ray Diffraction (XRD) | 30 | 4933 | 130,348 | 143,940 | 2 | 0.66 | 132 |
| Scanning Probe Microscopes (SPM) | 25 | 3520 | 69,680 | 70,870 | 2 | 0.25 | 161 |
| Surface Science Instruments (XPS, AES) | 60 | 5296 | 321,644 | 288,801 | 1 | 0.65 | 266 |
a
Full Time Equivalent, where one FTE corresponds to one person employed full time which is 40 hours per week in the USA.