Figure 5.

Force relaxation events and corresponding change in tip position in low- and high-force regimes. Top row: force curve for a representative penetration experiment in an untreated HEK cell. Bottom row: corresponding tip movement relative to glass. Middle column: low-force region showing several small force relaxation events with little change in tip position (baseline tip trajectory subtracted for display). Right column: high-force region showing six 5 nm penetration events for a total of 30 nm tip displacement. To see this figure in color, go online.