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. 2014 Nov 7;4:6964. doi: 10.1038/srep06964

Figure 4. Band offsets using x-ray photoelectron spectroscopy: XPS spectra of (a) Ge 3d core level Inline graphic and valence band maximum, VBM Inline graphic from thick Ge film, (b) As 3d Inline graphic core level and VBM Inline graphic from thick AlAs film, (c) As 3d, Ge 3d core levels from ~1.5 nm Ge/AlAs interface, and (d) energy-band alignment of the Ge/AlAs heterointerface, respectively.

Figure 4