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. 2014 Apr 21;20(12):951–963. doi: 10.1089/ten.tec.2013.0701

FIG. 2.

FIG. 2.

(a) Three-dimensional topographical images (atomic force microscopy [AFM] images) of control, S-CPT, S-PTT-1, and S-PTT-2 scaffolds, (b) single lines of the roughened surfaces of the AFM images, and (c) average roughness (Ra and RMS) values of the surfaces. AFM, atomic force microscopy. Color images available online at www.liebertpub.com/tec