Table 3.

Detailed fitting parameters for the log Kp vs. log P_L° plots for PCDDs/Fs and dl-PCBs at the two sampling sites.

Compound	Sampling Site	Slop (m)	Intercept (b)	R2	Level of Significance	Sampling Site	Slop (m)	Intercept (b)	R2	Level of Significance
PCDDs/Fs	SW (all temp.)	−0.54	−3.97	0.48	<0.001	AS (all temp.)	−0.94	−5.93	0.83	<0.001
	SW (temp. <10 °C)	−0.32	−2.85	0.20	<0.001	AS (temp. < 10 °C)	−0.82	−5.38	0.76	<0.001
	SW (10 °C < temp. < 20 °C)	−0.75	−5.17	0.62	<0.001	AS (10 °C < temp. < 20 °C)	−1.16	−7.13	0.85	<0.001
	SW (temp. > 20 °C)	−0.86	−5.24	0.75	<0.001	AS (temp. > 20 °C)	−1.09	−6.15	0.84	<0.001
dl-PCBs	SW (all temp.)	−0.76	−5.68	0.72	<0.001	AS (all temp.)	−0.80	−5.96	0.78	<0.001
	SW (temp. < 10 °C)	−0.84	−5.97	0.74	<0.001	AS (temp. < 10 °C)	−0.88	−6.25	0.93	<0.001
	SW (10 °C < temp. < 20 °C)	−0.70	−5.50	0.56	<0.001	AS (10 °C < temp. < 20 °C)	−0.99	−6.79	0.83	<0.001
	SW (temp. > 20 °C)	−0.66	−5.34	0.51	<0.001	AS (temp. > 20 °C)	−0.56	−5.17	0.43	<0.001