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. 2014 Oct 13;14(11):6356–6360. doi: 10.1021/nl5028183

Figure 3.

Figure 3

UV/vis Mach–Zehnder interferometry on coaxial metamaterial. (a) Schematic representation of the Mach–Zehnder interferometer used to determine the optical properties of the coaxial metamaterial. (b) Histograms built up from the collection of 300 measurements, for 6 different wavelengths for the sample with 168 nm Si cylinder outer diameter, pitch of 250 nm, and Si wall thickness of 15 nm (Table 1, sample 1).