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. 2014 Oct 8;6(22):20254–20260. doi: 10.1021/am505785t

Figure 3.

Figure 3

Responses of different AFM probes for investigation of OP high-aspect-ratio structures. (a–c) Different probe geometries used for AFM analyses of free-standing NPs. The SEM micrograph (scale bar = 300 nm) in panel a shows the geometry at the apex of the probe. Furthermore, below each sketch, the AFM height images of 550 nm high NPs obtained using the different probes are shown. (d) AFM cross section of the NPs using the (red) commercial, (green) FEBID modified, and (blue) FEBID modified tilt-corrected probe.