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. Author manuscript; available in PMC: 2016 Jan 1.
Published in final edited form as: Micron. 2014 Sep 26;68:70–76. doi: 10.1016/j.micron.2014.09.004

Figure 4.

Figure 4

Mixed backscattered electron and secondary electron image composed from the images in figure 3. Note that both the surface topography from the SE image and the atomic number sensitivity from the BSE image are preserved in this mixed signal image. Scale = 500 nm