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. 2014 Dec 15;4:7488. doi: 10.1038/srep07488

Figure 3.

Figure 3

(a) Gaussian fitting of the Hg 691.5 nm line profile recorded using the optical system with the grating of 1200 groove/mm and slit width of 50 μm. (b) The relationship between the Stark broadening width and the electron density for Te = 10,000 K and Te = 40,000 K. (c) Voigt fitting of the Ar 696.5 nm line profile recorded using the optical system with the grating of 1200 groove/mm and the slit width of 50 μm.