Figure 8.

FIB/SEM of ruptured yeast on NSS. (a–c) Slices from a series of SEM images through a ruptured ‘gum drop’ yeast cell. The face of the sample has been milled away using a gallium ion beam. The samples are covered with a thick layer of gold reducing off-line ion implantation artefacts that appear as surface lines or scratches on the face. (a) The cell as well as internal components such as the nucleus (asterisk) are clearly seen. The bright DD NSS contrasts nicely with the yeast cell. In this preparation, the cell wall has a vacuolated appearance (arrow), which can be seen along the NSS. (b) Shown here are the vacuoles extending down into the NSS, demonstrating the cell is intimate with the NSS and has deformed on the features of the NSS. (c) Neither the dark material nor the vacuoles are seen between the nanostructures of the surface not in contact with a cell (arrow). (d–f) Another example of a cell in the ‘gumdrop stage’ without vacuolation. Still dark material extends into the NSS (inset e) and this material is not present in areas lacking a cell (f, arrow).