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. 2014 Nov 25;30(50):15351–15355. doi: 10.1021/la504097f

Figure 4.

Figure 4

(a) Electron micrograph of a bar-shaped feature (7.2 μm in width and 1.9 μm in height) on PDMS and a topographic image obtained with an ICP. (b) Line profile from the ICP with SICM topographic image and line profile obtained from a surface profiler.