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. 2015 Jan 1;2(Pt 1):19–28. doi: 10.1107/S2052252514022155

Table 2. Data collection and processing, survey of refinements.

Beam size (mm) 0.6 Inline graphic 0.6
Scan mode Inline graphic
Scan range ()/ No. of scan steps 0.18/120
Resolution, s high/s max Inline graphic (1) 0.781/1.00
Completeness within s high/s max (%) 100/54.5
Total No. of reflections/unique reflections 8753/4729
R merge(all)/R merge(obs)/R sigma(all) 0.0123/0.0121/0.0146
Unique reflections with F 2 > 2(F 2) (NO) 3879
No. reflections/restraints/variables (NV) 4711/0/207
Final (shift/e.s.d.), max/mean 0.019/0.002
Final R indices [F 2 > 2(F 2)] R(F) = 0.0236, wR(F 2) = 0.0579
Final R indices (all data) R(F) = 0.0371, wR(F 2) = 0.0608
Weight parameters w A and w B 0.0364/0.0
Goodness of fit (GOF) on F 2 0.997
Flack x parameter 0.008(31)
Non-bonding extrema in final electron density (e3) 0.19 to 0.19

w = 1/[2(F o 2) + (w A P)2 + w B P], where P = [max (F o 2, 0) + 2F c 2]/3; R(F) = ||F o| |F c||/|F o|; wR(F 2) = {[w(F o 2 F c 2)2]/[w(F o 2)2]}1/2.

GOF = [w(F o 2 F c 2)2/(NO NV)]1/2.