Table II.

Average surface roughness (Ra) and root mean square (rms) (Rq) of the six substrates obtained from AFM topographic scans, over an area of 500 × 500 nm, are presented. The standard deviation is obtained from at least four scans.

	Ra (nm)	Rq (nm)
Glass	0.30 ± 0.01	0.42 ± 0.03
OTS	0.31 ± 0.01	0.41 ± 0.02
PEG	0.30 ± 0.01	0.41 ± 0.02
PS	0.37 ± 0.10	0.49 ± 0.15
PMMA	0.37 ± 0.07	0.48 ± 0.10
PDMS	0.30 ± 0.04	0.39 ± 0.08