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. 2014 Dec 8;14(12):23539–23562. doi: 10.3390/s141223539

Table 1.

FIB milling rates, masking ability and the kind of electrical contact to the n-type ZnO [11] data for a selection of metals commonly used in microelectronics and MEMS technology.

Ti Al Cr Au ZnO
FIB milling rate (Relative to Ti rate set to 100) 100 150 200 275 150
Masking ability Best Good Good Worst
Typical electrical contact with ZnO Ohmic Ohmic Schottky Schottky