Table 1.
FIB milling rates, masking ability and the kind of electrical contact to the n-type ZnO [11] data for a selection of metals commonly used in microelectronics and MEMS technology.
| Ti | Al | Cr | Au | ZnO | |
|---|---|---|---|---|---|
| FIB milling rate (Relative to Ti rate set to 100) | 100 | 150 | 200 | 275 | 150 |
| Masking ability | Best | Good | Good | Worst | – |
| Typical electrical contact with ZnO | Ohmic | Ohmic | Schottky | Schottky | – |