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. 2015 Feb;145(2):93–106. doi: 10.1085/jgp.201411304

Figure 6.

Figure 6.

Gating pore current after long depolarizations. (A) Current generated by ramp pulses (see protocols in inset), for R222Q (left), R225W (middle), and WT (right) channels (using solutions 1 and 5 listed in Table 1). The I-V curves were constructed by averaging values of current at each 5 mV. The voltage was calculated using the known time course of the ramp protocol. Thus, for purpose of clarity, the plotted points (mean ± SEM) do not represent steady-state currents, but they represent average current every 5 mV. The linear leak subtraction around −75 to −45 mV was performed to eliminate inherent linear leak. The insets show the currents in response to ramp protocols. Dashed lines indicate the current obtained without 500-ms predepolarization. Solid lines indicate the response after 500-ms predepolarization. (B) Histogram summarizing the inward gating pore current density at −135 mV recorded with or without 500-ms predepolarization. R222Q and R225W exhibit gating pore currents when compared with control ramp protocols without predepolarization (−5.6 ± 1.1 pA/pF, n = 5, for R222Q [*], and −3.3 ± 0.6, n = 3, for R225W [#]). ++, statistical difference between mutant and WT condition (P < 0.01). Data are expressed as means ± SEM. Differences were considered significant at P < 0.05 (*, #) or < 0.01 (++).