I08 soft X-ray microscopy |
X-ray scanning microscopy |
250 eV–4.2 keV |
operational |
I14 hard X-ray nanoprobe |
scanning X-ray fluorescence, X-ray spectroscopy and diffraction, small- and wide-angle X-ray scattering |
5–25 keV |
construction |
I18 microfocus spectroscopy |
XAS, extended X-ray absorption fine structure (EXAFS), fluorescence tomography, micro XRD |
2.05–20.5 keV |
operational |
B18 core EXAFS |
XAS |
2.05–35 keV |
operational |
I20 LOLA: X-ray spectroscopy |
X-ray absorption spectroscopy (XAS), energy dispersive EXAFS (EDE), X-ray emission spectroscopy (XES) |
dispersive branch: 6–26 keV |
commissioning |
|
|
scanning branch: 4–20 keV |
|
I21 inelastic X-ray scattering |
resonant/non-resonant inelastic scattering |
250–3000 eV |
construction |