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. 2015 Jan 14;6:6013. doi: 10.1038/ncomms7013

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(a) AFM image shows the topography of an as-cast BTR:PC₇₁BM (1:1 weight ratio) blend film. (b) TEM bright-field image of the as-cast film taken at a defocusing range of 3 μm. (c) Computer model generated from the TEM tomogram of the as-cast film. (d) Low-energy HAADF STEM image of the as-cast film at focus using a beam energy of 15 keV. (e) AFM image of the BTR:PC₇₁BM blend film after THF SVA for 15 s. (f) TEM bright-field image of the SVA-treated film at a defocusing range of 3 μm. (g) Computer model of the THF SVA film. (h) HAADF STEM image of the blend film after SVA treatment.