Figure 2.
Von Mises Equivalent Elastic Strain (µm/µm) distribution around the 5th electrode in the model 16 channel single shank planar silicon electrode. a) Note the strain is highest around the edges of electrode trace next to the edge of the iridium recording site. b) Cracking and degradation of the traces around the recording site can be observed in the SEM. Scale bar = 10 µm.