Table 1.

Surface roughness of each material type as indicated by optical profilometry

Material type	Surface roughness (µm)
HXL	2.38 ± 0.68
CM	3.11 ± 1.23
HXL VE 75 kGy	2.18 ± 0.83
HXL VE 150 kGy	1.53 ± 0.45
PEEK	0.69 ± 0.14

Values are expressed as mean ± SD; HXL = highly crosslinked UHMWPE; CM = compression-molded UHMWPE; HXL VE 150 kGy = vitamin E-loaded HXL crosslinked with 150 kGy gamma radiation; HXL VE 75 kGy = vitamin E-loaded HXL crosslinked with 75 kGy gamma radiation; PEEK = polyetheretherketone.