Figure 3. Curve Fitting results of complex refractive index for monolayer MoS₂.

(a) The contrast of monolayer MoS₂ as a function of the SiO₂ thickness under incident light wavelength of 651 nm (scattered open circles). The standard deviation of each point is shown by the error bar. The curve fitting result of the complex refractive index of monolayer MoS₂ at 651 nm is shown in the table in the inset. (b)The complex refractive index spectrum (scattered red circles) of monolayer MoS₂, obtained by curving fitting the relation between contrast and SiO₂ thickness relation with equation (3) under different incident light wavelength (from 400 nm to 750 nm). The red shadow shows the confidence interval, corresponding to a 95% confidence level. The black dashed lines show the complex refractive index spectrum of bulk MoS₂²¹.