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. 2015 Feb 16;5:8470. doi: 10.1038/srep08470

Figure 2. AFM images of (a1) ODTS-free Si substrate, (a2) 300 cycles of Pd on ODTS-free Si substrate, (a3) 300 cycles Pd + 25 cycles Pt on ODTS-free Si substrate, (b1) 2 h ODTS-coated Si substrate, (b2) 300 cycles of Pd on 2 h ODTS-coated Si substrate, (b3) 300 cycles Pd + 25 cycles Pt on 2 h ODTS-coated Si substrate.

Figure 2

Below the images show the sectional analysis of the corresponding samples.