Skip to main content
. 2015 Jan 1;71(Pt 1):22–27. doi: 10.1107/S205698901402595X

Table 6. Experimental details.

  (1) (2) (3) (4) (5)
Crystal data
Chemical formula [PdCl(C14H23N5)]NO3 [PdBr(C14H23N5)]NO3 [PdI(C14H2N5)]I0.5H2O [Pd(N3)(C14H23N5)]N3H2O [Pd(NCS)(C14H23N5)]2[Pd(NCS)4]
M r 465.23 509.69 630.58 469.85 1190.43
Crystal system, space group Monoclinic, P21/n Monoclinic, P21/n Triclinic, P Inline graphic Monoclinic, P21/c Triclinic, P Inline graphic
Temperature (K) 298 298 299 296 298
a, b, c () 11.046(2), 12.2941(15), 14.0978(16) 10.934(6), 12.443(4), 14.112(6) 12.013(4), 12.089(4), 15.162(5) 8.132(3), 22.851(5), 11.372(3) 9.0286(17), 10.532(2), 13.066(3)
, , () 90, 94.740(16), 90 90, 94.76(4), 90 106.17(2), 97.34(3), 106.79(3) 90, 109.03(2), 90 94.838(14), 100.947(12), 103.989(13)
V (3) 1907.9(5) 1913.4(14) 1972.0(11) 1997.8(10) 1172.5(4)
Z 4 4 4 4 1
Radiation type Mo K Mo K Mo K Mo K Mo K
(mm1) 1.14 3.08 4.08 0.96 1.45
Crystal size (mm) 0.40 0.12 0.10 0.60 0.40 0.18 0.20 0.15 0.04 0.50 0.40 0.40 0.40 0.40 0.12
 
Data collection
Diffractometer Siemens P4 Siemens P4 Siemens P4 Siemens P4 Siemens P4
Absorption correction scan (XSCANS; Siemens, 1996) scan (XSCANS; Siemens, 1996) scan (XSCANS; Siemens, 1996) scan (XSCANS; Siemens, 1996) scan (XSCANS; Siemens, 1996)
T min, T max 0.469, 0.517 0.206, 0.352 0.446, 0.523 0.266, 0.366 0.256, 0.378
No. of measured, independent and observed [I > 2(I)] reflections 4513, 3372, 2110 12224, 4962, 3329 8975, 6835, 4559 8431, 4032, 3528 8889, 5367, 4874
R int 0.044 0.080 0.043 0.056 0.038
(sin /)max (1) 0.596 0.677 0.595 0.623 0.650
 
Refinement
R[F 2 > 2(F 2)], wR(F 2), S 0.060, 0.158, 1.05 0.051, 0.148, 1.05 0.040, 0.101, 1.03 0.036, 0.097, 1.08 0.039, 0.107, 1.06
No. of reflections 3372 4962 6835 4032 5367
No. of parameters 230 231 414 248 282
H-atom treatment H-atom parameters constrained H-atom parameters constrained H-atom parameters constrained H-atom parameters constrained H-atom parameters constrained
max, min (e 3) 1.45, 1.11 1.10, 1.01 0.85, 1.04 0.55, 1.04 0.83, 1.06

Computer programs: XSCANS (Siemens, 1996), SHELXS2014, SHELXL2014 and SHELXTL (Sheldrick, 2008) and Mercury (Macrae et al., 2008).