Figure 3.
SEM images of the microroughened PEEK/n-HA/CF ternary composites.
Notes: (A) Control; (B) group 1; (C) group 2; and (D) group 3 with high-resolution images inserted on the top right.
Abbreviations: SEM, scanning electron microscope; PEEK/n-HA/CF, carbon fiber-reinforced polyetheretherketone–nanohydroxyapatite.
