Table 3.
Relative risk of admission using four models of event effect decay
| Model | Coefficient | Exp coefficient a | Log-likelihood of fitted model | p |
|---|---|---|---|---|
| Cumulative | .024 | 1.024 | −308.5503 | <.001 |
| 25% decay | .134 | 1.143 | −293.5533b | <.001 |
| 50% decay | .240 | 1.272 | −298.4862 | <.001 |
| 75% decay | .452 | 1.572 | −306.3194 | <.001 |
aExponentiated linear coefficients. bLowest absolute log-likelihood of fitted model.