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. 2015 Feb 25;3:6. doi: 10.1186/s40345-015-0022-4

Table 3.

Relative risk of admission using four models of event effect decay

Model Coefficient Exp coefficient a Log-likelihood of fitted model p
Cumulative .024 1.024 −308.5503 <.001
25% decay .134 1.143 −293.5533b <.001
50% decay .240 1.272 −298.4862 <.001
75% decay .452 1.572 −306.3194 <.001

aExponentiated linear coefficients. bLowest absolute log-likelihood of fitted model.