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. Author manuscript; available in PMC: 2016 Mar 1.
Published in final edited form as: Mater Sci Eng R Rep. 2015 Mar 1;89:1–48. doi: 10.1016/j.mser.2015.01.002

Figure 34.

Figure 34

Topography and transport properties of the interface of BiFeO3 thin films probed by conductive atomic force microscope (AFM). (a) Topography, where the dash line indicates the position of grain boundary. (b) Current image, where the dark contrast is indicative of increased leakage; (c) Selected current-voltage curves. Adapted from Ref. [195].